Title:
Residual stress moire interferometry of silcon crystals

Thumbnail Image
Files
e-25-a76_582701.pdf (124.66 MB)
Author(s)
Danyluk, Steven
Authors
Advisor(s)
Advisor(s)
Editor(s)
Associated Organization(s)
Series
Collections
Research Publications
Supplementary to
Permanent Link
http://hdl.handle.net/1853/55147
Abstract
Sponsor
Date Issued
1997-09
Extent
Resource Type
Text
Resource Subtype
Technical Report
Rights Statement
Rights URI