Title:
Reliability modeling and parametric yield prediction of GaAs multiple quantum well avalanche photodiodes
Reliability modeling and parametric yield prediction of GaAs multiple quantum well avalanche photodiodes
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Author(s)
Yun, Ilgu
Advisor(s)
May, Gary S.
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Date Issued
1997-12
Extent
233 bytes
Resource Type
Text
Resource Subtype
Dissertation
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Access restricted to authorized Georgia Tech users only.