Test support processor for enhanced testability of high performance integrated circuits

Author(s)
Zhou, Qing
Advisor(s)
Keezer, David C.
Editor(s)
Associated Organization(s)
Series
Supplementary to:
Abstract
Sponsor
Date
2001-08
Extent
234 bytes
Resource Type
Text
Resource Subtype
Dissertation
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Access restricted to authorized Georgia Tech users only.
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