Person:
de Heer,
Walter A.
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Publication Search Results
In situ imaging of field emission from individual carbon nanotubes and their structural damage
Nanomeasurements of individual carbon nanotubes by in situ TEM
A New Approach Towards Property Nanomeasurements Using In Situ TEM
Conductance quantization in multiwalled carbon nanotubes
Nanomeasurements in Transmission Electron Microscopy