Title:
In situ imaging of field emission from individual carbon nanotubes and their structural damage
In situ imaging of field emission from individual carbon nanotubes and their structural damage
Author(s)
Wang, Z. L. (Zhong Lin)
Gao, Rui Ping
de Heer, Walter A.
Poncharal, P.
Gao, Rui Ping
de Heer, Walter A.
Poncharal, P.
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Abstract
Field emission of individual carbon nanotubes was observed by in situ
transmission electron microscopy. A fluctuation in emission current was due to a
variation in distance between the nanotube tip and the counter electrode owing
to a "head-shaking" effect of the nanotube during field emission. Strong
field-induced structural damage of a nanotube occurs in two ways: a
piece-by-piece and segment-by-segment pilling process of the graphitic layers,
and a concentrical layer-by-layer stripping process. The former is believed
owing to a strong electrostatic force, and the latter is likely due to heating
produced by emission current that flowed through the most outer graphitic
layers.
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Date Issued
2002-02-04
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Article