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de Heer, Walter A.

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Author: Gao, Rui Ping × Author: Poncharal, P. ×

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In situ imaging of field emission from individual carbon nanotubes and their structural damage

2002-02-04 , Wang, Z. L. (Zhong Lin) , Gao, Rui Ping , de Heer, Walter A. , Poncharal, P.

Field emission of individual carbon nanotubes was observed by in situ transmission electron microscopy. A fluctuation in emission current was due to a variation in distance between the nanotube tip and the counter electrode owing to a "head-shaking" effect of the nanotube during field emission. Strong field-induced structural damage of a nanotube occurs in two ways: a piece-by-piece and segment-by-segment pilling process of the graphitic layers, and a concentrical layer-by-layer stripping process. The former is believed owing to a strong electrostatic force, and the latter is likely due to heating produced by emission current that flowed through the most outer graphitic layers.

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A New Approach Towards Property Nanomeasurements Using In Situ TEM

2001 , Wang, Z. L. (Zhong Lin) , Poncharal, P. , de Heer, Walter A. , Gao, Rui Ping

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in-situ transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing a one-to-one correspondence in structure-property characterization. Applications of the technique will be demonstrated on mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f= 10-').

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