Person:
Wong, C. P.

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Author: Li, Yi × Author: Moon, Kyoung-Sik × Author: Wong, C. P. × End date: 2010 × Start date: 2000 × search.filters.applied.f.isOrgUnitOfPublicationTitle: College of Engineering × search.filters.applied.f.resourcesubtype: Article ×

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Now showing 1 - 4 of 4
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    Enhanced Electrical Properties of Anisotropic Conductive Adhesive With $pi$ -Conjugated Self-Assembled Molecular Wire Junctions
    (Georgia Institute of Technology, 2009-09) Zhang, Rongwei ; Li, Yi ; Yim, Myung Jin ; Moon, Kyoung-Sik ; Lu, Daoqiang ; Wong, C. P.
    We have investigated the electrical properties of anisotropic conductive adhesive (ACA) joint using submicrometer- sized ( 500 nm in diameter) silver (Ag) particle as conductive filler with the effect of -conjugated self-assembled molecular wires. The ACAs with submicrometer-sized Ag particles have higher current carrying capability ( 3400 mA) than those with micro-sized Au-coated polymer particles ( 2000 mA) and Ag nanoparticles ( 2500 mA). More importantly, by construction of -conjugated self-assembled molecular wire junctions between conductive particles and integrated circuit (IC)/substrate, the electrical conductivity has increased by one order of magnitude and the current carrying capability of ACAs has improved by 600 mA. The crucial factors that govern the improved electrical properties are discussed based on the study of alignments and thermal stability of molecules on the submicrometer-sized Ag particle surface with surface-enhanced Raman spectroscopy (SERS), providing a fundamental understanding of conduction mechanism in ACA joints and guidelines for the formulation of high-performance ACAs in electronic packaging industry.
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    Novel Nano-Scale Conductive Films With Enhanced Electrical Performance and Reliability for High Performance Fine Pitch Interconnect
    (Georgia Institute of Technology, 2009-02) Li, Yi ; Yim, Myung Jin ; Moon, Kyoung-Sik ; Wong, C. P.
    In this paper, a novel nano-scale conductive film which combines the advantages of both traditional anisotropic conductive adhesives/films (ACAs/ACFs) and nonconductive adhesives/films (NCAs/NCFs) is introduced for next generation high-performance ultra-fine pitch packaging applications. This novel interconnect film possesses the properties of electrical conduction along the z direction with relatively low bonding pressure (ACF-like) and the ultra-fine pitch (< 30 μm) capability (NCF-like). The nano-scale conductive film also allows a lower bonding pressure than NCF to achieve a much lower joint resistance (over two orders of magnitude lower than typical ACF joints) and higher current carrying capability. With low temperature sintering of nano-silver fillers, the joint resistance of the nano-scale conductive film was as low as 10―5 Ohm. The reliability of the nano-scale conductive film after high temperature and humidity test (85°C/85% RH) was also improved compared to the NCF joints. The insertion loss of nano-scale conductive film joints up to 10 GHz was almost the same as that of the standard ACF or NCF joints, suggesting that the nano-scale conductive film is suitable for reliable high-frequency adhesive joints in microelectronics packaging.
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    Investigation of electrical contact resistance for nonconductive film functionalized with Π -conjugated self-assembled molecules
    (Georgia Institute of Technology, 2007-02-26) Dong, Hai ; Li, Yi ; Yim, Myung Jin ; Moon, Kyoung-Sik ; Wong, C. P.
    Nonconductive adhesive/nonconductive film (NCA/NCF) bonding technology has attracted increasing research interests as lead-free interconnect. During bonding, heat and pressure are applied and the direct physical contacts between the two surfaces of integrated circuit bump and substrate bond pad can be achieved. The electrical contact resistance of a NCA/NCF joint is controlled by the pressure, roughness and NCA/NCF material properties. An accurate prediction of contact resistance can help guide experiment setup towards improving the electrical performance of NCA/NCF. In this study, a model is developed and correlated to experiments. The effects of NCA/NCF material properties on electrical contact resistance are investigated.
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    Electrical Property Improvement of Electrically Conductive Adhesives Through In-Situ Replacement by Short-Chain Difunctional Acids
    (Georgia Institute of Technology, 2006-03) Wong, C. P. ; Li, Yi ; Moon, Kyoung-Sik
    To improve the electrical properties of electrically conductive adhesives (ECAs), short-chain difunctional acids, such as malonic acid (acid M), adipic acid (acid A), and terephthalic acid (acid T) were introduced into a typical isotropic conductive adhesive formulation. By in-situ replacement of the commonly used surfactant-stearic acid in silver(Ag) flakes, such difunctional acids can increase the conductivity of ECAs. With the addition of malonic acid and adipic acid, which only have short chain single-bond hydrocarbon between the dicarboxylic groups, the conductivity of the typical conductive adhesives was improved significantly. Terephthalic acid, however, deteriorates the conductivity due to the rigid aromatic structure in the molecule. Dynamic mechanical analysis and thermomechanical study indicated the improved electrical properties with malonic and adipic acids were achieved without negatively affecting the mechanical and physical properties of ECAs.