Title:
Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes
Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes
| dc.contributor.author | Gnecco, Enrico | en_US |
| dc.contributor.author | Riedo, Elisa | en_US |
| dc.contributor.author | King, William P. | en_US |
| dc.contributor.author | Marder, Seth R. | en_US |
| dc.contributor.author | Szoszkiewicz, Robert | en_US |
| dc.contributor.corporatename | Georgia Institute of Technology. Center for Organic Photonics and Electronics | en_US |
| dc.date.accessioned | 2013-02-15T20:59:28Z | |
| dc.date.available | 2013-02-15T20:59:28Z | |
| dc.date.issued | 2009-06 | |
| dc.description | © 2009 American Physical Society. The electronic version of this article is the complete one and can be found online at: http://link.aps.org/doi/10.1103/PhysRevB.79.235421 | en_US |
| dc.description | DOI: 10.1103/PhysRevB.79.235421 | en_US |
| dc.description.abstract | We discuss the time and temperature evolution of the nanometer-scale surface undulations (ripples) produced by a heated atomic force microscope (AFM) tip scanning across surfaces of several amorphous polymers. During linear zigzag scanning we obtain pseudolinear ripples approximately perpendicular to the fast scan direction in a range of scan rates and probe temperatures. As expected, the size of the ripples increases massively in the vicinity of the glass temperature for each polymer. We also examine a different case in which the AFM tip follows a circular path. Contrary to the ``steady{\'\' circular ripples which rotate along the scanning path during consecutive scans. The group velocity of the circular ripples is 2 orders of magnitude lower than the scan speed. We interpret the experimental data using a phenomenological model accounting for erosion and smoothing effects caused by the probing tip. | en_US |
| dc.identifier.citation | Gnecco, Enrico; Riedo, Elisa; King, William P.; Marder, Seth R. and Szoszkiewicz, Robert, "Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes," Physical Review B , 79, 23, (June 2009). | en_US |
| dc.identifier.doi | 10.1103/PhysRevB.79.235421 | en_US |
| dc.identifier.issn | 1098-0121 (print) | |
| dc.identifier.issn | 1550-235X (online) | |
| dc.identifier.uri | http://hdl.handle.net/1853/46211 | |
| dc.language.iso | en_US | en_US |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.publisher.original | American Physical Society | en_US |
| dc.subject | Atomic force microscopy | en_US |
| dc.subject | Group velocity | en_US |
| dc.subject | Pseudolinear ripples | en_US |
| dc.subject | Thermal probes | en_US |
| dc.subject | Tip | en_US |
| dc.subject | Zigzag scanning | en_US |
| dc.title | Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes | en_US |
| dc.type | Text | |
| dc.type.genre | Article | |
| dspace.entity.type | Publication | |
| local.contributor.author | Marder, Seth R. | |
| local.contributor.corporatename | Center for Organic Photonics and Electronics | |
| relation.isAuthorOfPublication | d1ec1d90-12ad-40fb-8f0b-b1a751e796fe | |
| relation.isOrgUnitOfPublication | 43f8dc5f-0678-4f07-b44a-edbf587c338f |
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