Title:
Synchrotron polychromatic x-ray diffraction tomography of large-grained polycrystalline materials

dc.contributor.advisor Stock, Stuart R.
dc.contributor.author Piotrowski, David P. en_US
dc.contributor.department Materials science and engineering en_US
dc.contributor.department Metallurgical engineering en_US
dc.date.accessioned 2008-02-21T12:32:09Z
dc.date.available 2008-02-21T12:32:09Z
dc.date.issued 1996-05 en_US
dc.description.degree M.S. en_US
dc.identifier.bibid 423390 en_US
dc.identifier.uri http://hdl.handle.net/1853/19985
dc.publisher Georgia Institute of Technology en_US
dc.rights Access restricted to authorized Georgia Tech users only. en_US
dc.subject.lcsh Crystals en_US
dc.subject.lcsh X-rays Diffraction en_US
dc.subject.lcsh Tomography en_US
dc.subject.lcsh Materials Fatigue en_US
dc.title Synchrotron polychromatic x-ray diffraction tomography of large-grained polycrystalline materials en_US
dc.type Text
dc.type.genre Thesis
dspace.entity.type Publication
local.contributor.corporatename School of Materials Science and Engineering
local.contributor.corporatename College of Engineering
relation.isOrgUnitOfPublication 21b5a45b-0b8a-4b69-a36b-6556f8426a35
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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