Title:
Growth direction and morphology of ZnO nanobelts revealed by combining in situ atomic force microscopy and polarized Raman spectroscopy
Growth direction and morphology of ZnO nanobelts revealed by combining in situ atomic force microscopy and polarized Raman spectroscopy
| dc.contributor.author | Lucas, Marcel | |
| dc.contributor.author | Wang, Z. L. (Zhong Lin) | |
| dc.contributor.author | Riedo, Elisa | |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Physics | |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Materials Science and Engineering | |
| dc.date.accessioned | 2010-05-25T16:38:42Z | |
| dc.date.available | 2010-05-25T16:38:42Z | |
| dc.date.issued | 2010-01-14 | |
| dc.description | ©2010 The American Physical Society. The electronic version of this article is the complete one and can be found online at: http://link.aps.org/doi/10.1103/PhysRevB.81.045415 | en_US |
| dc.description | DOI: 10.1103/PhysRevB.81.045415 | |
| dc.description.abstract | Control over the morphology and structure of nanostructures is essential for their technological applications, since their physical properties depend significantly on their dimensions, crystallographic structure, and growth direction. A combination of polarized Raman (PR) spectroscopy and atomic force microscopy (AFM) is used to characterize the growth direction, the presence of point defects and the morphology of individual ZnO nanobelts. PR-AFM data reveal two growth modes during the synthesis of ZnO nanobelts by physical vapor deposition. In the thermodynamics-controlled growth mode, nanobelts grow along a direction close to [0001], their morphology is growth-direction dependent, and they exhibit no point defects. In the kinetics-controlled growth mode, nanobelts grow along directions almost perpendicular to [0001], and they exhibit point defects. | en_US |
| dc.identifier.citation | Marcel Lucas, Zhong Lin Wang, and Elisa Riedo, "Growth direction and morphology of ZnO nanobelts revealed by combining in situ atomic force microscopy and polarized Raman spectroscopy," Physical review. B, Condensed matter and materials physics, 81 (2010) 045415 | en_US |
| dc.identifier.issn | 1098-0121 | |
| dc.identifier.uri | http://hdl.handle.net/1853/33306 | |
| dc.language.iso | en_US | en_US |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.publisher.original | American Physical Society | |
| dc.subject | Nanostructures | en_US |
| dc.subject | Polarized Raman spectroscopy | en_US |
| dc.subject | Atomic force microscopy | en_US |
| dc.subject | ZnO nanobelts | en_US |
| dc.subject | Morphology | en_US |
| dc.subject | Growth direction | en_US |
| dc.title | Growth direction and morphology of ZnO nanobelts revealed by combining in situ atomic force microscopy and polarized Raman spectroscopy | en_US |
| dc.type | Text | |
| dc.type.genre | Article | |
| dspace.entity.type | Publication | |
| local.contributor.corporatename | School of Materials Science and Engineering | |
| local.contributor.corporatename | College of Engineering | |
| relation.isOrgUnitOfPublication | 21b5a45b-0b8a-4b69-a36b-6556f8426a35 | |
| relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 |