Title:
Neural network and vector quantization classifiers for recognition and inspection applications
Neural network and vector quantization classifiers for recognition and inspection applications
dc.contributor.advisor | Smith, Mark J. T. | |
dc.contributor.author | Brosnan, Timothy Myers | en_US |
dc.contributor.department | Electrical and Computer Engineering | en_US |
dc.contributor.department | Electric Engineering | en_US |
dc.date.accessioned | 2007-06-29T11:32:15Z | |
dc.date.available | 2007-06-29T11:32:15Z | |
dc.date.issued | 1997-12 | en_US |
dc.description.degree | M.S. | en_US |
dc.identifier.bibid | 463219 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/15378 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
dc.subject.lcsh | Quality control Optical methods | en_US |
dc.subject.lcsh | Engineering inspection Automation | en_US |
dc.subject.lcsh | Computer vision | en_US |
dc.title | Neural network and vector quantization classifiers for recognition and inspection applications | en_US |
dc.type | Text | |
dc.type.genre | Thesis | |
dspace.entity.type | Publication | |
local.contributor.corporatename | School of Electrical and Computer Engineering | |
local.contributor.corporatename | College of Engineering | |
relation.isOrgUnitOfPublication | 5b7adef2-447c-4270-b9fc-846bd76f80f2 | |
relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 |
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