Title:
Low-cost testing of ADCs and DACs
Low-cost testing of ADCs and DACs
| dc.contributor.author | Chatterjee, Abhijit | |
| dc.contributor.author | Goyal, Shalabh | |
| dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Electrical and Computer Engineering | |
| dc.date.accessioned | 2016-03-29T18:35:51Z | |
| dc.date.available | 2016-03-29T18:35:51Z | |
| dc.date.issued | 2006-12-01 | |
| dc.description | Issued as final report | |
| dc.description.sponsorship | Semiconductor Research Corporation | |
| dc.identifier.uri | http://hdl.handle.net/1853/54680 | |
| dc.publisher | Georgia Institute of Technology | |
| dc.relation.ispartofseries | School of Electrical and Computer Engineering ; Project no. 97270 | |
| dc.subject | Alternate testing | |
| dc.subject | Dynamic tests | |
| dc.subject | Jitter | |
| dc.title | Low-cost testing of ADCs and DACs | |
| dc.title.alternative | Optimal testing of high-speed DACS and ADCS using RF design | |
| dc.type | Text | |
| dc.type.genre | Technical Report | |
| dspace.entity.type | Publication | |
| local.contributor.author | Chatterjee, Abhijit | |
| local.contributor.corporatename | School of Electrical and Computer Engineering | |
| local.contributor.corporatename | College of Engineering | |
| local.contributor.corporatename | Office of Sponsored Programs | |
| local.relation.ispartofseries | OSP Final Research Reports | |
| relation.isAuthorOfPublication | 01f2340e-40b6-449d-8f8a-80b6599c8ffb | |
| relation.isOrgUnitOfPublication | 5b7adef2-447c-4270-b9fc-846bd76f80f2 | |
| relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 | |
| relation.isOrgUnitOfPublication | c315e181-6c1e-4968-b8cf-a66220b5bcf2 | |
| relation.isSeriesOfPublication | 628bc9a1-6779-42aa-aa38-1dcd6fcd12ca |
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