Title:
Specific contact resistance at metal/carbon nanotube interfaces

Thumbnail Image
Author(s)
Jackson, Roderick
Graham, Samuel
Authors
Advisor(s)
Advisor(s)
Editor(s)
Associated Organization(s)
Series
Supplementary to
Abstract
In this report, the specific contact resistance between a thin film single wall carbon nanotube electrode and a deposited silver contact was measured. The specific contact resistance was found to be 20 mΩ cm², which is an order of magnitude higher than typically observed in standard Si photovoltaic technology. We demonstrate that when utilized as the transparent anode in organic photovoltaics, the specific contact resistance has the potential to induce non-negligible resistive power losses. Thus, specific contact resistance will adversely affect the performance of these systems and should therefore be addressed. © 2009 American Institute of Physics.
Sponsor
Date Issued
2009-01-05
Extent
Resource Type
Text
Resource Subtype
Article
Rights Statement
Rights URI