Title:
Depth resolved luminescence from oriented ZnO nanowires
Depth resolved luminescence from oriented ZnO nanowires
Author(s)
Rosenberg, R. A.
Haija, M. Abu
Vijayalakshmi, K.
Zhou, Jun
Xu, Sheng
Wang, Z. L. (Zhong Lin)
Haija, M. Abu
Vijayalakshmi, K.
Zhou, Jun
Xu, Sheng
Wang, Z. L. (Zhong Lin)
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Abstract
We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2° to 33°. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of ~14 nm.
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Date Issued
2009-12-14
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Article