Title:
Signature based testing of analog and RF circuits
Signature based testing of analog and RF circuits
dc.contributor.advisor | Chatterjee, Abhijit | |
dc.contributor.author | Voorakaranam, Ramakrishna | en_US |
dc.contributor.department | Electrical and Computer Engineering | en_US |
dc.date.accessioned | 2007-06-22T13:19:51Z | |
dc.date.available | 2007-06-22T13:19:51Z | |
dc.date.issued | 2002-05 | en_US |
dc.description.degree | Ph.D. | en_US |
dc.identifier.bibid | 629362 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/15009 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
dc.subject.lcsh | Integrated circuits Testing | en_US |
dc.title | Signature based testing of analog and RF circuits | en_US |
dc.type | Text | |
dc.type.genre | Dissertation | |
dspace.entity.type | Publication | |
local.contributor.advisor | Chatterjee, Abhijit | |
local.contributor.corporatename | School of Electrical and Computer Engineering | |
local.contributor.corporatename | College of Engineering | |
relation.isAdvisorOfPublication | 01f2340e-40b6-449d-8f8a-80b6599c8ffb | |
relation.isOrgUnitOfPublication | 5b7adef2-447c-4270-b9fc-846bd76f80f2 | |
relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 |
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