Title:
Intrinsic and extrinsic parameter fluctuation limits on gigascale integration (GSI)

dc.contributor.advisor Meindl, James D.
dc.contributor.author Tang, Xinghai en_US
dc.contributor.department Electrical and Computer Engineering en_US
dc.date.accessioned 2007-02-09T20:55:07Z
dc.date.available 2007-02-09T20:55:07Z
dc.date.issued 1999-08 en_US
dc.description.degree Ph.D. en_US
dc.format.extent 237 bytes
dc.format.mimetype text/html
dc.identifier.bibid 499407 en_US
dc.identifier.uri http://hdl.handle.net/1853/13305
dc.language.iso en_US
dc.publisher Georgia Institute of Technology en_US
dc.rights Access restricted to authorized Georgia Tech users only. en_US
dc.subject.lcsh Metal oxide semiconductor field-effect transistors Computer simulation en_US
dc.subject.lcsh Integrated circuits Very large scale integration en_US
dc.subject.lcsh Electronic circuit design en_US
dc.title Intrinsic and extrinsic parameter fluctuation limits on gigascale integration (GSI) en_US
dc.type Text
dc.type.genre Dissertation
dspace.entity.type Publication
local.contributor.corporatename School of Electrical and Computer Engineering
local.contributor.corporatename College of Engineering
relation.isOrgUnitOfPublication 5b7adef2-447c-4270-b9fc-846bd76f80f2
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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