Title:
Surface composition determined by analysis of impact radiation
Surface composition determined by analysis of impact radiation
dc.contributor.author | Thomas, Edward Wilfrid | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. School of Physics | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
dc.date.accessioned | 2011-08-25T11:30:16Z | |
dc.date.available | 2011-08-25T11:30:16Z | |
dc.date.issued | 1974 | en_US |
dc.description | Issued as Annual report, Project no. G-41-629 | en_US |
dc.identifier.other | 91942 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/40765 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.relation.ispartofseries | School of Physics ; Project no. G-41-629 | en_US |
dc.subject.lcsh | Sputtering (Physics) | en_US |
dc.subject.lcsh | Surfaces (Technology) | en_US |
dc.title | Surface composition determined by analysis of impact radiation | en_US |
dc.type | Text | |
dc.type.genre | Technical Report | |
dspace.entity.type | Publication | |
local.contributor.corporatename | College of Sciences | |
local.contributor.corporatename | School of Physics | |
local.contributor.corporatename | Office of Sponsored Programs | |
local.relation.ispartofseries | OSP Final Research Reports | |
relation.isOrgUnitOfPublication | 85042be6-2d68-4e07-b384-e1f908fae48a | |
relation.isOrgUnitOfPublication | 2ba39017-11f1-40f4-9bc5-66f17b8f1539 | |
relation.isOrgUnitOfPublication | c315e181-6c1e-4968-b8cf-a66220b5bcf2 | |
relation.isSeriesOfPublication | 628bc9a1-6779-42aa-aa38-1dcd6fcd12ca |
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