Person:
Graham,
Samuel
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Micro-Raman thermometry in the presence of complex stresses in GaN devices
Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy
Temperature and doping dependence of phonon lifetimes and decay pathways in GaN
Role of interface disorder on thermal boundary conductance using a virtual crystal approach
Stress relaxation in GaN by transfer bonding on Si substrates