(Georgia Institute of Technology, 2011-09-15)
Frietsch, Rainer; Jung, Taehyun; Neuhaeusler, Peter; van Looy, Bart
Utilizing a large panel dataset, this paper examines the linkage between patenting and export performance at the country and technology field level. The analysis assesses whether common patent value indicators like patent citations have any additional explanatory power to estimate the export value of countries by technology fields.