Organizational Unit:
Georgia Tech Manufacturing Institute

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https://hdl.handle.net/1853/70647
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https://finding-aids.library.gatech.edu/agents/corporate_entities/1153

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New concept for low cost, high throughput inspection for cracks in PV manufacturing

2012-06 , Danyluk, Steven , Yang, Yeyuan (Chris)

The research objectives of this project were to validate a new concept in surface inspection of thin crystalline silicon wafers of the type used in photovoltaic manufacturing with electrostatic imaging technique (Kelvin probes) to reveal surface cracks.

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Instrumentation for the testing of friction and wear under very high electromagnetic stress

2007-02-01 , Danyluk, Steven

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Development of Micro-Scale Grinding System and Grinding Mechanics

2006-03-15 , Park, Hyung-Wook , Liang, Steven Y.

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Modeling and Analysis of Fixturing Dynamic Stability in Machining

2006-03-15 , Deng, Haiyan

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Analysis of the effects of wafer slicing on the mechanical integrity of silicon wafers

2011-12-31 , Melkote, Shreyes N. , Danyluk, Steven , Wu, Hao

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DURIP / instrumentation for the testing of friction & wear under very high electromagnetic stress

2007-01-31 , Danyluk, Steven , Cowan, Richard S. , Bair, Scott S. , Streator, Jeffrey L.

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Tool Life and White Layer Formation in Interrupted Hard Turning With Binderless cBN Tool

2006-03-15 , Subbiah, Sathyan , Newton, Thomas , Melkote, Shreyes N.

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Efficient representation and reduction of extreme uncertainty in environmentally benign design and manufacture

2009-12-26 , Paredis, Christiaan J. J. , Bras, Berdinus A.

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Future PMRC Research Topics

2006-03-15 , Liang, Steven Y.

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Georgia Tech Precision Machining

2006-03-15 , Melkote, Shreyes N.

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