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Georgia Tech Manufacturing Institute
Georgia Tech Manufacturing Institute
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ItemNew concept for low cost, high throughput inspection for cracks in PV manufacturing(Georgia Institute of Technology, 2012-06) Danyluk, Steven ; Yang, Yeyuan (Chris)The research objectives of this project were to validate a new concept in surface inspection of thin crystalline silicon wafers of the type used in photovoltaic manufacturing with electrostatic imaging technique (Kelvin probes) to reveal surface cracks.
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ItemAnalysis of the effects of wafer slicing on the mechanical integrity of silicon wafers(Georgia Institute of Technology, 2011-12-31) Melkote, Shreyes N. ; Danyluk, Steven ; Wu, Hao
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ItemEfficient representation and reduction of extreme uncertainty in environmentally benign design and manufacture(Georgia Institute of Technology, 2009-12-26) Paredis, Christiaan J. J. ; Bras, Berdinus A.
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ItemInstrumentation for the testing of friction and wear under very high electromagnetic stress(Georgia Institute of Technology, 2007-02-01) Danyluk, Steven
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ItemDURIP / instrumentation for the testing of friction & wear under very high electromagnetic stress(Georgia Institute of Technology, 2007-01-31) Danyluk, Steven ; Cowan, Richard S. ; Bair, Scott S. ; Streator, Jeffrey L.
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ItemCapturing design process information and rationale to support knowledge-based design and analysis integration(Georgia Institute of Technology, 2004-08-30) Peak, Russell S.
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ItemProduct data-driven analysis in the life cycle support process : tasks 1 and 2(Georgia Institute of Technology, 1998) Peak, Russell S.
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ItemDesign-analysis associativity technology for PSI : phase 1 report : pilot demonstration of STEP-based stress templates(Georgia Institute of Technology, 1998) Peak, Russell S.