Organizational Unit:
Georgia Tech Manufacturing Institute
Georgia Tech Manufacturing Institute
Permanent Link
Research Organization Registry ID
Description
Previous Names
Parent Organization
Parent Organization
Includes Organization(s)
Organizational Unit
ArchiveSpace Name Record
Publication Search Results
Now showing
1 - 7 of 7
-
ItemNew concept for low cost, high throughput inspection for cracks in PV manufacturing(Georgia Institute of Technology, 2012-06) Danyluk, Steven ; Yang, Yeyuan (Chris)The research objectives of this project were to validate a new concept in surface inspection of thin crystalline silicon wafers of the type used in photovoltaic manufacturing with electrostatic imaging technique (Kelvin probes) to reveal surface cracks.
-
ItemAnalysis of the effects of wafer slicing on the mechanical integrity of silicon wafers(Georgia Institute of Technology, 2011-12-31) Melkote, Shreyes N. ; Danyluk, Steven ; Wu, Hao
-
ItemInstrumentation for the testing of friction and wear under very high electromagnetic stress(Georgia Institute of Technology, 2007-02-01) Danyluk, Steven
-
ItemDURIP / instrumentation for the testing of friction & wear under very high electromagnetic stress(Georgia Institute of Technology, 2007-01-31) Danyluk, Steven ; Cowan, Richard S. ; Bair, Scott S. ; Streator, Jeffrey L.
-
ItemMARC Research Center Overview(Georgia Institute of Technology, 2006-03-15) Danyluk, Steven
-
ItemPlasticity Induced Damage on Grinding of Polycrystalline γ-TiAl(Georgia Institute of Technology, 2003-10-15) Murtagian, Gregorio Roberto ; Danyluk, Steven
-
ItemNIST ATP(Georgia Institute of Technology, 2000-10-18) Danyluk, Steven