(Georgia Institute of Technology, 2006-09)
Ebong, Abasifreke; Kim, Dong Seop; Yelundur, Vijay; Upadhyaya, V.; Rounsaville, Brian; Upadhyaya, A. D.; Tate, K.; Rohatgi, Ajeet
In this paper we report on the role of forming gas anneal on the fill factor of a small area cell and efficiency loss due to scaling the cell area. Solar cells that are under-fired and those fired at the optimum peak firing cycle showed very marginal response to forming gas anneal. Forming gas anneal is most effective for over-fired cells. The high temperature for the over-fired cells is believed to enhance Ag crystallites growth and the formation of a thick glass layer between the Ag front grid and silicon material. The forming gas anneal aids in reducing the glass to its metal, increase the conductivity of the glass and decrease the contact resistance. Solar cells with four different areas (4-cm(2), 49-cm(2), 100-cm(2) and 156-cm(2)) that were fired at the optimized peak firing temperature showed excellent fill factors without the forming gas anneal treatment. The fill factor was not a strong function of the area even though individually the n-factor and series resistance varied due to edge recombination. The efficiency and short circuit current density showed a quadratic relation with the cell area. The short circuit current density showed a difference of 3.2 mA/cm2 between the 4-cm2 and 156-cm2 cells. The short circuit current density decreased with area due to shading, diffusion length and back surface recombination velocity or Leff, front surface recombination velocity, and area loss due to edge isolation. Improved understanding of these effects coupled with grid design and process optimization can bridge the gap between the small and large area cells.
(Georgia Institute of Technology, 2005-06)
Ebong, Abasifreke; Yelundur, Vijay; Upadhyaya, V.; Rounsaville, Brian; Upadhyaya, A. D.; Tate, K.; Rohatgi, Ajeet; Kalejs, Juris P.
ABSTRACT: In this paper we report on the screen-printed solar cells fabricated on three types of silicon materials; float zone (FZ), HEM multicrystalline and EFG ribbon with POCl3 and belt furnace diffused emitters. The belt furnace diffused emitters involved one- and two-side phosphorus spin-on to assess the contaminating effect of the IR belt. The solar cells with POCl3 emitters and co-firing of screen-printed contacts produced efficiencies of 17.3% on FZ, 16.4% on HEM and 15.5% on EFG ribbon silicon. Solar cells with two-side phosphorus emitters diffused on the belt furnace, produced efficiencies of 17.2%, 16.0%, and 15.1%, respectively, on FZ, HEM and EFG ribbon silicon. However, appreciably lower efficiencies of 15.5%, 15.5%, and 14.1% were obtained, respectively, on FZ, HEM and EFG ribbon silicon for belt-diffused emitters with only one-side phosphorus spin-on with the other side on the belt. This difference in efficiency is reflected in Voc loss for the belt-diffused emitters compared to the POCl(3) emitter cells. The IQE measurements supported that solar cells with belt-diffused emitter with two-side phosphorus spin-on and POCl(3) emitter cells had comparable Jsc. However, the cell with phosphorus spin-on on one-side gave much lower IQE because of poor bulk lifetime or the contamination due to direct contact with the belt. These results indicate that the belt emitters can account for appreciable loss in the performance of the many current commercial cells; however, this loss can be regained by applying phosphorus dopant to both side of the wafer.