Title:
Theoretical investigation of breakdown effects in wide band gap semiconductor materials
Theoretical investigation of breakdown effects in wide band gap semiconductor materials
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Author(s)
Brennan, Kevin F.
Bellotti, E. (Enrico)
Farahmand, Maziar
Haralson, Joe Nathan, II
Ruden, P. Paul
Albrecht, John D.
Sutandi, Agust
Doshi, Bhautik K.
Bicknell-Tassius, Robert N.
Grunthaner, Frank
Nilsson, Hans-Erik
Goano, Michele
Ghillino, Enrico
Ghione, Giovanni
Garetto, Carlo
Zhang, Yumin
Trew, Robert
Gebara, Edward
Heo, Deukhyoun
Suh, Young
Laskar, Joy
Yu, Tsung-Hsing
Hjelm, M.
Bellotti, E. (Enrico)
Farahmand, Maziar
Haralson, Joe Nathan, II
Ruden, P. Paul
Albrecht, John D.
Sutandi, Agust
Doshi, Bhautik K.
Bicknell-Tassius, Robert N.
Grunthaner, Frank
Nilsson, Hans-Erik
Goano, Michele
Ghillino, Enrico
Ghione, Giovanni
Garetto, Carlo
Zhang, Yumin
Trew, Robert
Gebara, Edward
Heo, Deukhyoun
Suh, Young
Laskar, Joy
Yu, Tsung-Hsing
Hjelm, M.
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Date Issued
2002
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202256793 bytes
Resource Type
Text
Resource Subtype
Technical Report