Title:
Materials Characterization Techniques at the NRC
Materials Characterization Techniques at the NRC
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Authors
Book, Gregory W.
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Abstract
When building up multiple layers of materials in fabricating CMOS, MEMS, optics, SAW and other nano and
micro scale devices, understanding the material composition and properties is very important. The final
operation of the devices greatly depends on the properties of the materials used in the device, as well as the
interfacial interaction between layers of materials. Within the NRC exist a plethora of materials
characterization techniques for both structural and chemical analysis. This talk will serve as a "Capability
Passdown" to the NRC user base, as well as an explanation of how each technique works, and what
information can be obtained from the available processes.
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Date Issued
2011-09-27
Extent
46:50 minutes
Resource Type
Moving Image
Resource Subtype
Lecture