Title:
A New Approach Towards Property Nanomeasurements Using In Situ TEM
A New Approach Towards Property Nanomeasurements Using In Situ TEM
Author(s)
Wang, Z. L. (Zhong Lin)
Poncharal, P.
de Heer, Walter A.
Gao, Rui Ping
Poncharal, P.
de Heer, Walter A.
Gao, Rui Ping
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Abstract
Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in-situ transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing a one-to-one correspondence in structure-property characterization. Applications of the technique will be demonstrated on mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f= 10-').
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Date Issued
2001
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Article