Title:
Parallel test techniques for multi-chip modules
Parallel test techniques for multi-chip modules
Author(s)
Sasidhar, Koppolu
Advisor(s)
Chatterjee, Abhijit
Editor(s)
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Abstract
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Date Issued
1997-08
Extent
241 bytes
Resource Type
Text
Resource Subtype
Dissertation
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Access restricted to authorized Georgia Tech users only.