Title:
Test support processor for enhanced testability of high performance integrated circuits
Test support processor for enhanced testability of high performance integrated circuits
Authors
Zhou, Qing
Authors
Advisors
Keezer, David C.
Advisors
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Organizational Unit
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Abstract
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Date Issued
2001-08
Extent
234 bytes
Resource Type
Text
Resource Subtype
Dissertation
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Access restricted to authorized Georgia Tech users only.