Slow positron annihilation spectroscopy applied to the analysis of the semiconductor, silicide, and titanium nitride structures
Loading...
Author(s)
Frost, Robert Lewis
Advisor(s)
DeWald, A. Bruce
Editor(s)
Collections
Supplementary to:
Permanent Link
Abstract
Sponsor
Date
1990-08
Extent
Resource Type
Text
Resource Subtype
Dissertation
Rights Statement
Access restricted to authorized Georgia Tech users only.