Title:
Scanning Ion Probe Systems And Methods Of Use Thereof

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dc.contributor.patentcreator Fedorov, Andrei G.
dc.date.accessioned 2017-05-12T14:28:46Z
dc.date.available 2017-05-12T14:28:46Z
dc.date.filed 6/4/2008
dc.date.issued 4/27/2010
dc.description.abstract Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc B82Y35/00
dc.identifier.cpc G01Q30/02
dc.identifier.cpc G01Q30/14
dc.identifier.patentapplicationnumber 12/132730
dc.identifier.patentnumber 7705299
dc.identifier.uri http://hdl.handle.net/1853/57846
dc.identifier.uspc 250/307
dc.title Scanning Ion Probe Systems And Methods Of Use Thereof
dc.type Text
dc.type.genre Patent
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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