Title:
Integrated-optic Spectrometer And Method

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dc.contributor.patentcreator Schwerzel, Robert E.
dc.contributor.patentcreator Hartman, Nile F.
dc.date.accessioned 2017-05-12T14:27:38Z
dc.date.available 2017-05-12T14:27:38Z
dc.date.filed 5/5/1999
dc.date.issued 5/1/2001
dc.description.abstract An integrated-optic spectrometer is disclosed for analyzing the composition of light reflected off a sample under analysis. In a simplified embodiment, the spectrometer includes a buffer, located on the top of a substrate, which is etched to create a diffraction grating having grating lines. The diffraction grating and grating lines are formed to provide diffraction of discrete wavelengths of light, while providing for maximum transmission of non-diffracted wavelengths. A waveguide is fabricated on top of the etched buffer through which the reflected light is directed. A photodiode detector array is located above the waveguide into which the diffracted wavelengths are diffracted, providing an analysis of the composition of the reflected light. A clad encompasses the integrated-optic spectrometer, thereby providing protection from outside interference.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc G01J3/0259
dc.identifier.cpc G01J3/18
dc.identifier.cpc G01J3/1895
dc.identifier.patentapplicationnumber 09/305391
dc.identifier.patentnumber 6226083
dc.identifier.uri http://hdl.handle.net/1853/57381
dc.identifier.uspc 356/305
dc.title Integrated-optic Spectrometer And Method
dc.type Text
dc.type.genre Patent
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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