Reconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology

Howard, Duane Clarence

Title:

Reconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology

dc.contributor.advisor	Cressler, John D.
dc.contributor.author	Howard, Duane Clarence
dc.contributor.committeeMember	Tentzeris, Manos M.
dc.contributor.committeeMember	Papapolymerou, John
dc.contributor.committeeMember	Wang, Hua
dc.contributor.committeeMember	Henry, Todd J.
dc.contributor.department	Electrical and Computer Engineering
dc.date.accessioned	2014-05-22T15:26:21Z
dc.date.available	2014-05-22T15:26:21Z
dc.date.created	2014-05
dc.date.issued	2014-02-26
dc.date.submitted	May 2014
dc.date.updated	2014-05-22T15:26:21Z
dc.description.abstract	The design of reconfigurable microwave and millimeter-wave circuit components and on-chip testing circuitry are demonstrated. These components are designed to enable the mitigation of process faults, aging, radiation effects, and other mechanisms that lead to performance degradation in circuits and systems. The presented work is primarily based on SiGe HBTs in BiCMOS technology and harnesses the inherent resilience of SiGe to mechanisms that degrade transistor performance. However, CMOS FETs are also used in limited applications, such as in the design of switches, op-amps, and DACs. Individual circuit blocks and circuit systems are characterized with the aim of evaluating their performance under nominal conditions as well as in the context of extreme environments and other deleterious phenomena.
dc.description.degree	Ph.D.
dc.format.mimetype	application/pdf
dc.identifier.uri	http://hdl.handle.net/1853/51823
dc.language.iso	en_US
dc.publisher	Georgia Institute of Technology
dc.subject	Microwave systems
dc.subject	RF systems
dc.subject	Tunable circuits
dc.subject	Automated testing
dc.subject	Built-in-self testing
dc.subject	Self-healing
dc.subject.lcsh	Integrated circuits
dc.subject.lcsh	Microwave integrated circuits
dc.subject.lcsh	Electronic circuits
dc.subject.lcsh	Microwave circuits
dc.title	Reconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology
dc.type	Text
dc.type.genre	Dissertation
dspace.entity.type	Publication
local.contributor.advisor	Cressler, John D.
local.contributor.corporatename	School of Electrical and Computer Engineering
local.contributor.corporatename	College of Engineering
relation.isAdvisorOfPublication	2df1dcb5-f1ce-4e65-a1eb-021f8a8ab8bc
relation.isOrgUnitOfPublication	5b7adef2-447c-4270-b9fc-846bd76f80f2
relation.isOrgUnitOfPublication	7c022d60-21d5-497c-b552-95e489a06569
thesis.degree.level	Doctoral