Title:
Microprobe analysis
Microprobe analysis
dc.contributor.author | Brown, John Lee | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Engineering Experiment Station | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
dc.date.accessioned | 2011-12-01T12:30:11Z | |
dc.date.available | 2011-12-01T12:30:11Z | |
dc.date.issued | 1965 | en_US |
dc.description | Issued as Letter report [1-2], Project no. A-232-344 | en_US |
dc.identifier.other | 326734 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/42047 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.relation.ispartofseries | Engineering Experiment Station ; Project no. A-232-344 | en_US |
dc.subject.lcsh | Electron microscopes | en_US |
dc.title | Microprobe analysis | en_US |
dc.type | Text | |
dc.type.genre | Technical Report | |
dspace.entity.type | Publication |
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