Aluminumnano-Layersuperconducting Thin Films
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Dadkhah, Shohreh
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Abstract
The fascinating properties of superconductors have led to widespread use in applications such as quantum computing, MRI machines, and particle accelerators. However, understanding how factors like material thickness influence these properties remains a key challenge in the field.
We focus on investigating the relationship between the thickness of aluminum nanolayers in superconductors and their corresponding resistivity and critical temperature. Aluminum, being a well-characterized low-temperature superconductor, provides an ideal model system for exploring these effects. By systematically varying the thickness of the aluminum films and conducting comprehensive microstructural and electrical characterization, this study aims to elucidate the fundamental mechanisms that govern superconductivity in thin films. The research presented in this thesis not only contributes to the fundamental understanding of superconductivity but also has practical implications for the design and optimization of superconducting materials for technological applications. By advancing our knowledge of how thickness and microstructure affect the superconducting properties of aluminum-based films, this work lays the groundwork for future innovations in both low and high-temperature superconducting technologies.
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2024-12-16
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