Title:
Session 2: Artificial Intelligence Process Control & Scaling Nanotechnology
Session 2: Artificial Intelligence Process Control & Scaling Nanotechnology
| dc.contributor.author | Putman, Matthew | |
| dc.contributor.corporatename | Georgia Institute of Technology. Institute for Electronics and Nanotechnology | en_US |
| dc.contributor.corporatename | Nanotronics Imaging | en_US |
| dc.date.accessioned | 2017-07-26T19:52:03Z | |
| dc.date.available | 2017-07-26T19:52:03Z | |
| dc.date.issued | 2017-06-28 | |
| dc.description | Presented on June 28, 2017 at 10:45 a.m. in the Marcus Nanotechnology Building, Room 1116. | en_US |
| dc.description | Presented as part of the IEN Industry Seminar Series, "The Future of Advanced Manufacturing". | en_US |
| dc.description | Matthew Putman is the founder and CEO of Nanotronics, a company that enables microscope systems to see, and recognize objectives never seen or categorized automatically before. Putman handles company vision, helps with integration of products, and works with management, the board and investors. | en_US |
| dc.description | Runtime: 48:41 minutes | en_US |
| dc.description.abstract | This seminar will focus on the future of advanced manufacturing and how Nanotronics is bringing tools and software to market to help achieve that vision. Central to that vision is the concept of Artificial Intelligence Process Control – a concept that will be enabled through innovation taking place in our labs and from feedback at customer sites that are beginning to transform their production lines with our technology. We plan to address advancements in image analysis software, automation, and a variety of specific use-cases we’ve encountered over the course of the past several years. | en_US |
| dc.format.extent | 48:41 minutes | |
| dc.identifier.uri | http://hdl.handle.net/1853/58439 | |
| dc.language.iso | en_US | en_US |
| dc.relation.ispartofseries | IEN Industry Seminar Series | en_US |
| dc.subject | Cognitive artificial intelligence | en_US |
| dc.subject | Microscope | en_US |
| dc.subject | Nanoscale | en_US |
| dc.title | Session 2: Artificial Intelligence Process Control & Scaling Nanotechnology | en_US |
| dc.type | Moving Image | |
| dc.type.genre | Presentation | |
| dspace.entity.type | Publication | |
| local.contributor.corporatename | Institute for Electronics and Nanotechnology (IEN) | |
| local.relation.ispartofseries | IEN Industry Seminar Series | |
| relation.isOrgUnitOfPublication | 5d316582-08fe-42e1-82e3-9f3b79dd6dae | |
| relation.isSeriesOfPublication | ea1f67bf-5efb-42a7-b27c-45185d006477 |
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