Plastic deformation of pentagonal silver nanowires: Comparison between AFM nanoindentation and atomistic simulations
Author(s)
Lucas, Marcel
Leach, Austin M.
Hunyadi, Simona E.
Gall, Ken
Murphy, Catherine J.
Riedo, Elisa
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Abstract
The plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations
of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 Gpa ) is comparable to the tensile yield strength predicted by atomistic simulations.
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2008-06
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