Title:
Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts
Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts
| dc.contributor.author | Lucas, Marcel | |
| dc.contributor.author | Wang, Z. L. (Zhong Lin) | |
| dc.contributor.author | Riedo, Elisa | |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Materials Science and Engineering | |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Physics | |
| dc.date.accessioned | 2009-09-28T20:44:56Z | |
| dc.date.available | 2009-09-28T20:44:56Z | |
| dc.date.issued | 2009-08-04 | |
| dc.description | ©2009 American Institute of Physics. The electronic version of this article is the complete one and can be found online at: http://link.aip.org/link/?APPLAB/95/051904/1 | en |
| dc.description | DOI: 10.1063/1.3177065 | |
| dc.description.abstract | We present a method, polarized Raman (PR) spectroscopy combined with atomic force microscopy (AFM), to characterize in situ and nondestructively the structure and the physical properties of individual nanostructures. PR-AFM applied to individual ZnO nanobelts reveals the interplay between growth direction, point defects, morphology, and mechanical properties of these nanostructures. In particular, we find that the presence of point defects can decrease the elastic modulus of the nanobelts by one order of magnitude. More generally, PR-AFM can be extended to different types of nanostructures, which can be in as-fabricated devices. | en |
| dc.identifier.citation | Marcel Lucas, Zhong Lin Wang, and Elisa Riedo, "Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts," Applied Physics Letters 95 (2009) 051904 | en |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.uri | http://hdl.handle.net/1853/30213 | |
| dc.language.iso | en_US | en |
| dc.publisher | Georgia Institute of Technology | en |
| dc.publisher.original | American Institute of Physics | |
| dc.subject | Atomic force microscopy | |
| dc.subject | Elastic moduli | |
| dc.subject | II-VI semiconductors | |
| dc.subject | Nanobelts | |
| dc.subject | Point defects | |
| dc.subject | Raman spectra | |
| dc.subject | Wide band gap semiconductors | |
| dc.subject | Zinc compounds | |
| dc.title | Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts | en |
| dc.type | Text | |
| dc.type.genre | Article | |
| dspace.entity.type | Publication | |
| local.contributor.corporatename | School of Materials Science and Engineering | |
| local.contributor.corporatename | College of Engineering | |
| relation.isOrgUnitOfPublication | 21b5a45b-0b8a-4b69-a36b-6556f8426a35 | |
| relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 |