Title:
Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts
Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts
Author(s)
Lucas, Marcel
Wang, Z. L. (Zhong Lin)
Riedo, Elisa
Wang, Z. L. (Zhong Lin)
Riedo, Elisa
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Abstract
We present a method, polarized Raman (PR) spectroscopy combined with atomic force microscopy
(AFM), to characterize in situ and nondestructively the structure and the physical properties of
individual nanostructures. PR-AFM applied to individual ZnO nanobelts reveals the interplay
between growth direction, point defects, morphology, and mechanical properties of these
nanostructures. In particular, we find that the presence of point defects can decrease the elastic
modulus of the nanobelts by one order of magnitude. More generally, PR-AFM can be extended to
different types of nanostructures, which can be in as-fabricated devices.
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Date Issued
2009-08-04
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Article