Title:
Automated diagnosis of path delay faults in digital integrated circuits

dc.contributor.advisor Chatterjee, Abhijit
dc.contributor.author Pant, Pankaj en_US
dc.contributor.department Electrical and Computer Engineering en_US
dc.date.accessioned 2007-03-01T18:52:16Z
dc.date.available 2007-03-01T18:52:16Z
dc.date.issued 2000-08 en_US
dc.description.degree Ph.D.
dc.format.extent 236 bytes
dc.format.mimetype text/html
dc.identifier.bibid 562776 en_US
dc.identifier.uri http://hdl.handle.net/1853/13556
dc.language.iso en_US
dc.publisher Georgia Institute of Technology en_US
dc.rights Access restricted to authorized Georgia Tech users only. en_US
dc.subject.lcsh Electronic circuits Testing en_US
dc.subject.lcsh Electronic circuits Design and construction en_US
dc.title Automated diagnosis of path delay faults in digital integrated circuits en_US
dc.type Text
dc.type.genre Dissertation
dspace.entity.type Publication
local.contributor.advisor Chatterjee, Abhijit
local.contributor.corporatename School of Electrical and Computer Engineering
local.contributor.corporatename College of Engineering
relation.isAdvisorOfPublication 01f2340e-40b6-449d-8f8a-80b6599c8ffb
relation.isOrgUnitOfPublication 5b7adef2-447c-4270-b9fc-846bd76f80f2
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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