Problem Solving Using Light and Electron Microscopy

Brown, Rich

Title:

Problem Solving Using Light and Electron Microscopy

dc.contributor.author	Brown, Rich
dc.contributor.corporatename	Georgia Institute of Technology. Microelectronics Research Center	en_US
dc.contributor.corporatename	Georgia Institute of Technology. Nanotechnology Research Center	en_US
dc.contributor.corporatename	MVA Scientific Consultants	en_US
dc.date.accessioned	2013-03-22T20:58:32Z
dc.date.available	2013-03-22T20:58:32Z
dc.date.issued	2013-03-12
dc.description	Rich Brown presented a lecture at the Nano@Tech Meeting on March 12, 2013 at 12 noon in room 1116 of the Marcus Nanotechnology Building.	en_US
dc.description	Rich has a Masters degree in Forensic Chemistry from Northeastern University and has studied and worked with microscopes for the past 30 years to characterize fumes, dusts, white powders and contamination. Rich has presented papers at the American Academy of Forensic Sciences, InterMicro and many other societies on the proper use of the microscope for chemical analysis. Rich is an expert photomicrographer and videomicrographer specializing in hot stage microscopy, ion mill cross-section polishing and small particle handling.
dc.description	Runtime: 40:17 minutes
dc.description.abstract	Using a combination of microscopical techniques, Rich applies polarized light microscopy (PLM), Fourier transform infrared microspectroscopy, (FTIR), confocal Raman microscopy, (CRM), scanning electron microscopy-energy dispersive x-ray spectrometry (SEM-EDS) and transmission electron microscopy (TEM) to solve problems in research and industry. Typically the use of a microscope is the only way to approach problems that involve fine particles that have found their way into or onto a product resulting in some form of contamination. Rich will demonstrate, through the use of case examples, how many particle based problems can be solved using a common sense approach and a strong background in light and electron microscopy.	en_US
dc.embargo.terms	null	en_US
dc.format.extent	40:17 minutes
dc.identifier.uri	http://hdl.handle.net/1853/46490
dc.language.iso	en_US	en_US
dc.publisher	Georgia Institute of Technology	en_US
dc.relation.ispartofseries	Nano@Tech Lecture Series
dc.subject	Metrology	en_US
dc.subject	Microscopy	en_US
dc.subject	Nanoparticles	en_US
dc.subject	Nanotechnology	en_US
dc.title	Problem Solving Using Light and Electron Microscopy	en_US
dc.type	Moving Image
dc.type.genre	Lecture
dspace.entity.type	Publication
local.contributor.corporatename	Institute for Electronics and Nanotechnology (IEN)
local.relation.ispartofseries	Nano@Tech Lecture Series
relation.isOrgUnitOfPublication	5d316582-08fe-42e1-82e3-9f3b79dd6dae
relation.isSeriesOfPublication	accfbba8-246e-4389-8087-f838de8956cf