Title:
Larger Posterior Mode Wavelet Thresholding and Applications

dc.contributor.author Cutillo, Luisa
dc.contributor.author Jung, Yoon Young
dc.contributor.author Ruggeri, Fabrizio
dc.contributor.author Vidakovic, Brani
dc.contributor.corporatename Georgia Institute of Technology. Dept. of Biomedical Engineering
dc.contributor.corporatename Emory University. Dept. of Biomedical Engineering
dc.contributor.corporatename Ewha Woman’s University (Korea)
dc.contributor.corporatename Università di Napoli. Dipartimento di matematica e applicazioni "R. Caccioppoli"
dc.contributor.corporatename Consiglio nazionale delle ricerche (Italy). Istituto di Matematica Applicata e Tecnologie Informatiche
dc.date.accessioned 2008-11-26T17:51:21Z
dc.date.available 2008-11-26T17:51:21Z
dc.date.issued 2005-07-01
dc.description.abstract This paper explores the thresholding rules induced by a variation of the Bayesian MAP principle. The MAP rules are Bayes actions that maximize the posterior. The proposed rule is thresholding and always picks the mode of the posterior larger in absolute value, thus the name LPM. We demonstrate that the introduced shrinkage performs comparably to several popular shrinkage techniques. The exact risk properties of the thresholding rule are explored, as well. We provide extensive simulational analysis and apply the proposed methodology to real-life experimental data coming from the field of Atomic Force Microscopy. en
dc.identifier.uri http://hdl.handle.net/1853/25840
dc.language.iso en_US en
dc.publisher Georgia Institute of Technology en
dc.relation.ispartofseries Biomedical Engineering Technical Report ; 14/2005 en
dc.subject Wavelet thresholding en
dc.subject Larger posterior mode
dc.subject Maximum a posteriori
dc.subject Atomic force microscopy
dc.title Larger Posterior Mode Wavelet Thresholding and Applications en
dc.type Text
dc.type.genre Technical Report
dspace.entity.type Publication
local.contributor.author Vidakovic, Brani
local.contributor.corporatename Wallace H. Coulter Department of Biomedical Engineering
local.contributor.corporatename College of Engineering
relation.isAuthorOfPublication 1463fd97-3d52-4269-afac-97f6f7f46fcd
relation.isOrgUnitOfPublication da59be3c-3d0a-41da-91b9-ebe2ecc83b66
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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