Title:
Signature driven low cost test, diagnosis and tuning of wireless systems

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dc.contributor.advisor Chatterjee, Abhijit
dc.contributor.author Devarakond , Shyam Kumar en_US
dc.contributor.committeeMember Keezer, David
dc.contributor.committeeMember Ma, Xiaoli
dc.contributor.committeeMember Milor, Linda
dc.contributor.committeeMember Sitaraman, Suresh
dc.contributor.department Electrical and Computer Engineering en_US
dc.date.accessioned 2013-06-15T02:43:19Z
dc.date.available 2013-06-15T02:43:19Z
dc.date.issued 2013-03-26 en_US
dc.description.abstract With increased and varied performance demands, it is essential that complex multi-standard radio/systems coexist on a same chip. To have cost and performance benefits, these analog/RF systems are implemented in scaled nanometer nodes. At these nodes, the high level of variability in process variations is making the task of manufacturing high fidelity systems a challenge leading to yield and reliability issues. Hence, in the post-manufacturing phase, test and diagnosis steps are critical to identify the cause and effect of the process variations. Further, intelligent post-manufacturing tuning techniques are required to correct the effect of process variations on analog/RF systems. In this work, a die-level concurrent test and diagnosis approach using optimized measurements obtained in high volume manufacturing environment is proposed for analog/RF circuits. Such a simultaneous test and diagnosis methodology enables monitoring parametric process shifts and providing rapid feedback to the fab to minimize or prevent yield loss. In the case of devices that are continuously operating in the field, an efficient on-line diagnosis approach has been developed to perform reliability related prognosis. For advanced RF technologies such as MIMO-OFDM systems, a rapid system-level testing scheme is presented that performs concurrent testing of the multiple RF chains. Depending on the availability of the computational resources and system tuning knobs, different low-cost methodologies for post-manufacture tuning or self-healing of RF SISO/MIMO systems are developed. These include faster digital monitoring and tuning techniques, on-chip tuning techniques using digital logic that enables die-level self-tuning, and DSP-based power conscious iterative techniques for SISO/MIMO RF systems. An adaptive power-performance tuning technique is developed for those devices that have a post-manufacture power consumption value that is more than the acceptable limit. These intelligent post-manufacturing techniques result in reduced manufacturing cost, improved yield, and reliability of analog/RF systems. en_US
dc.description.degree PhD en_US
dc.identifier.uri http://hdl.handle.net/1853/47594
dc.publisher Georgia Institute of Technology en_US
dc.subject Analog/RF self-tuning en_US
dc.subject Spice-level diagnosis en_US
dc.subject Analog/RF test en_US
dc.subject.lcsh Wireless communication systems
dc.subject.lcsh Radio
dc.subject.lcsh Radio frequency
dc.subject.lcsh Mixed signal circuits
dc.title Signature driven low cost test, diagnosis and tuning of wireless systems en_US
dc.type Text
dc.type.genre Dissertation
dspace.entity.type Publication
local.contributor.advisor Chatterjee, Abhijit
local.contributor.corporatename School of Electrical and Computer Engineering
local.contributor.corporatename College of Engineering
relation.isAdvisorOfPublication 01f2340e-40b6-449d-8f8a-80b6599c8ffb
relation.isOrgUnitOfPublication 5b7adef2-447c-4270-b9fc-846bd76f80f2
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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