Title:
Method And Apparatus For Low Energy Electron Enhanced Etching Of Substrates

dc.contributor.patentcreator Martin, Kevin P.
dc.contributor.patentcreator Gillis, Harry P.
dc.contributor.patentcreator Choutov, Dmitri A.
dc.date.accessioned 2017-05-12T14:27:25Z
dc.date.available 2017-05-12T14:27:25Z
dc.date.filed 8/28/1996
dc.date.issued 3/16/1999
dc.description.abstract A method of low-damage, anisotropic etching of substrates including mounting the substrate upon the anode in a DC plasma reactor and subjecting the substrate to a plasma of low-energy electrons and a species reactive with the substrate. An apparatus for conducting low-damage, anisotropic etching including a DC plasma reactor, a permeable wall hollow cold cathode, an anode, and means for mounting the substrate upon the anode.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc H01J37/32018
dc.identifier.cpc H01J37/32596
dc.identifier.cpc H01J37/32027
dc.identifier.patentapplicationnumber 08/705902
dc.identifier.patentnumber 5882538
dc.identifier.uri http://hdl.handle.net/1853/57291
dc.identifier.uspc 216/71
dc.title Method And Apparatus For Low Energy Electron Enhanced Etching Of Substrates
dc.type Text
dc.type.genre Patent
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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