Title:
Nanoelectronics manufacture, inspection, and repair using thermal dip pen nanolithography
Nanoelectronics manufacture, inspection, and repair using thermal dip pen nanolithography
dc.contributor.author | King, William P. | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. School of Mechanical Engineering | en_US |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
dc.date.accessioned | 2009-04-28T17:45:43Z | |
dc.date.available | 2009-04-28T17:45:43Z | |
dc.date.issued | 2006-11-20 | en_US |
dc.description | Issued as final report | en_US |
dc.description.sponsorship | United States. Office of Naval Research | en_US |
dc.identifier.other | 9391 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/27846 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.relation.ispartofseries | School of Mechanical Engineering ; Project no. E-25-6LV | en_US |
dc.title | Nanoelectronics manufacture, inspection, and repair using thermal dip pen nanolithography | |
dc.type | Text | |
dc.type.genre | Technical Report | |
dspace.entity.type | Publication | |
local.contributor.corporatename | George W. Woodruff School of Mechanical Engineering | |
local.contributor.corporatename | Office of Sponsored Programs | |
local.contributor.corporatename | College of Engineering | |
local.relation.ispartofseries | OSP Final Research Reports | |
relation.isOrgUnitOfPublication | c01ff908-c25f-439b-bf10-a074ed886bb7 | |
relation.isOrgUnitOfPublication | c315e181-6c1e-4968-b8cf-a66220b5bcf2 | |
relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 | |
relation.isSeriesOfPublication | 628bc9a1-6779-42aa-aa38-1dcd6fcd12ca |
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