Title:
Determining Enclosure Breach Electromagnetically
Determining Enclosure Breach Electromagnetically
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Abstract
A structure breach may be determined. A sensor, provided in the structure, may be driven with a constant frequency signal. The sensor may comprise a first conductive element and a second conductive element. The first conductive element may be substantially parallel with the second conductive element. A standing wave pattern may be induced on the sensor by the constant frequency signal reflecting off a termination point of the sensor. A least one characteristic of the sensor caused by the voltage standing wave pattern may be measured. A breach occurrence in the structure may be determined when the measured at least one characteristic varies from a previously determined value by a predetermined amount. The first conductive element and the second conductive element may be sandwiched between two layers comprising the structure. The structure may comprise a shipping container floor. The detected breach may comprise an opening greater than nine square inches.
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3/25/2014
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Patent