Title:
High-pressure Quartz Crystal Microbalance
High-pressure Quartz Crystal Microbalance
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Abstract
Described is an apparatus for measuring mass change under high pressure, comprising: a high pressure cell comprising a reference quartz crystal microbalance sensor and a sample quartz crystal microbalance sensor, wherein the sample quartz crystal microbalance sensor is coated with a test sample selected from the group consisting of nanoporous materials and metal-organic frameworks; a pressure sensor operatively connected to the high pressure cell; a thermocouple operatively connected to the high pressure cell, wherein the high pressure cell is maintained at a pre-selected temperature; a gas inlet fluidly connected to the high pressure cell; and a gas outlet fluidly connected to the high pressure cell. Also described are methods of making and using the apparatus.
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Date Issued
5/6/2014
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Patent