Title:
A new technique for measuring the elctromagnetic properties of rotationally symmetric materials
A new technique for measuring the elctromagnetic properties of rotationally symmetric materials
Author(s)
Humbert, William R.
Advisor(s)
Scott, Waymond R.
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Abstract
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Date Issued
1997-08
Extent
Resource Type
Text
Resource Subtype
Dissertation
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Access restricted to authorized Georgia Tech users only.