Textural analysis for defect detection in automated inspection systems
Author(s)
Piepmeier, Jenelle Armstrong
Advisor(s)
Dickerson, Stephen L.
Editor(s)
Collections
Supplementary to:
Permanent Link
Abstract
Sponsor
Date
1995-05
Extent
Resource Type
Text
Resource Subtype
Thesis
Rights Statement
Access restricted to authorized Georgia Tech users only.