Title:
Systems And Methods For Testing Integrated Circuits
Systems And Methods For Testing Integrated Circuits
Files
Author(s)
Advisor(s)
Editor(s)
Collections
Supplementary to
Permanent Link
Abstract
Systems and methods for digital-based, standards-compatible, testing of analog circuits embedded inside integrated circuits. In this regard, one such system can be broadly described by a test stimulus generator that transmits a binary-level test-stimulus signal into an analog circuit located inside an integrated circuit; a converter that converts an analog output signal from the analog circuit into a digital output signal; a boundary-scan register chain that transmits the digital output signal out of the integrated circuit, and a test equipment that receives the digital output signal using the IEEE 1149.1 boundary-scan standard and analyzes the digital output signal to compute one or more specifications of the analog circuit located inside the integrated circuit.
Sponsor
Date Issued
4/18/2006
Extent
Resource Type
Text
Resource Subtype
Patent