Title:
Dual-Energy CT Through Primary Beam Modulation

dc.contributor.patentcreator Zhu, Lei
dc.contributor.patentcreator Petrongolo, Jr. Michael Joseph
dc.date.accessioned 2022-07-08T14:21:39Z
dc.date.available 2022-07-08T14:21:39Z
dc.date.filed 6/29/2017
dc.date.issued 11/16/2021
dc.description.abstract Disclosed herein is a system and method, which utilize primary beam modulation to enable single-scan dual-energy CT (DECT) on a conventional CT scanner. An attenuation sheet with a spatially-varying pattern is placed between the x-ray source and the imaged object. During the CT scan, the modulator selectively hardens the x-ray beam at specific detector locations. Thus, this method simultaneously acquires high and low energy data at each projection angle. High and low energy CT images can then reconstructed from the projections via an iterative CT reconstruction algorithm, which accounts for the spatial modulation of the projected x-rays.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc A61B 6/025
dc.identifier.cpc A61B 6/03
dc.identifier.cpc A61B 6/032
dc.identifier.patentapplicationnumber US 16/310,930
dc.identifier.patentnumber 11172893
dc.identifier.uri http://hdl.handle.net/1853/67063
dc.title Dual-Energy CT Through Primary Beam Modulation
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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